Implications of angle of incidence in SEU testing of modern circuits

Author

Reed, R.A. ; McNulty, P.J. ; Abdel-Kader, W.G.

Author_Institution

Dept. of Phys. & Astron., Clemson Univ., SC, USA

Volume

41

Issue

6

fYear

1994

Firstpage

2049

Lastpage

2054

Abstract

Simulations show that ignoring the angular dependence of proton SEU cross sections produces errors in predictions of SEU rates in space. Moreover, they suggest that devices with thin sensitive volumes may upset to protons at grazing incidence despite high threshold LET values (>80 MeV cm/sup 2/) at normal incidence. Incorporating angular effects in space predictions requires accurate knowledge of the dimensions of the sensitive volume associated with the SEU-sensitive junction, especially the thickness. A method is proposed for using proton SEU measurements at different angles and energies combined with simulations to determine the thickness of the sensitive volume and to test the reliability of the predictions.<>

Keywords

digital integrated circuits; errors; integrated circuit testing; monolithic integrated circuits; proton effects; SEU rates; SEU testing; SEU-sensitive junction; angle of incidence; angular dependence; high threshold LET values; proton SEU cross sections; proton SEU measurements; sensitive volume thickness; space predictions; Circuit testing; Energy measurement; Extraterrestrial measurements; Modems; Predictive models; Protons; Satellites; Silicon; Thickness measurement; Volume measurement;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.340541

Filename

340541