Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz

Author

Chahine, Imad ; Kadi, Moncef ; Gaboriaud, Eric ; Louis, Anne ; Mazari, Bélahcène

Author_Institution

Res. Inst. for Embedded Syst. (IRSEEM), Ecole Super. d´´Ing. (ESIGELEC), Rouen

Volume

50

Issue

2

fYear

2008

fDate

5/1/2008 12:00:00 AM

Firstpage

285

Lastpage

293

Abstract

This paper deals with the characterization, as well as the modeling, of the susceptibility of integrated circuits (ICs) to conducted electromagnetic disturbances such as a continuous-wave disturbance. Based on accurate measurement results, a robust mathematical model to predict the susceptibility of a CMOS inverter is developed. This model is based on a neural network approach and is validated up to 1 GHz for different test criteria. A good agreement between measurements and simulated results is reported. The mathematical model is implemented in a software tool such as Advanced Design System in order to facilitate its operation in the evaluation of the susceptibility of ICs.

Keywords

CMOS digital integrated circuits; electromagnetic interference; integrated circuit testing; magnetic susceptibility; neural nets; CMOS inverter; electromagnetic disturbances; frequency 1 GHz; integrated circuits susceptibility; neural network approach; robust mathematical model; Circuit testing; Electromagnetic measurements; Electromagnetic modeling; Integrated circuit measurements; Integrated circuit modeling; Inverters; Mathematical model; Neural networks; Robustness; Semiconductor device modeling; Direct power injection (DPI) method; electromagnetic compatibility (EMC); integrated circuits (ICs); neural network (NN) applications; neural network (NN) applications; susceptibility;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2008.918983

Filename

4517022