Title :
On the angular dependence of proton induced events and charge collection [SRAMs]
Author :
Levinson, J. ; Barak, J. ; Zentner, A. ; Akkerman, A. ; Lifshitz, Y. ; Victoria, M. ; Hajdas, W. ; Alurralde, M.
Author_Institution :
Soreq Nucl. Res. Center, Yavne, Israel
Abstract :
Careful measurements of the angular dependence of proton induced SEU and SEL in HM65162 SRAMs and of energy deposited by protons in thin surface barrier detectors are reported. We found a very weak anisotropy whose behavior is described by our model.<>
Keywords :
SRAM chips; proton effects; HM65162 SRAMs; SEL; SEU; angular dependence; charge collection; proton induced events; single event latchup; single event upset; static RAM; thin surface barrier detectors; Anisotropic magnetoresistance; Belts; Detectors; Energy measurement; Extraterrestrial measurements; Face detection; Protons; Random access memory; Satellites; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
