• DocumentCode
    1215760
  • Title

    On the angular dependence of proton induced events and charge collection [SRAMs]

  • Author

    Levinson, J. ; Barak, J. ; Zentner, A. ; Akkerman, A. ; Lifshitz, Y. ; Victoria, M. ; Hajdas, W. ; Alurralde, M.

  • Author_Institution
    Soreq Nucl. Res. Center, Yavne, Israel
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    2098
  • Lastpage
    2102
  • Abstract
    Careful measurements of the angular dependence of proton induced SEU and SEL in HM65162 SRAMs and of energy deposited by protons in thin surface barrier detectors are reported. We found a very weak anisotropy whose behavior is described by our model.<>
  • Keywords
    SRAM chips; proton effects; HM65162 SRAMs; SEL; SEU; angular dependence; charge collection; proton induced events; single event latchup; single event upset; static RAM; thin surface barrier detectors; Anisotropic magnetoresistance; Belts; Detectors; Energy measurement; Extraterrestrial measurements; Face detection; Protons; Random access memory; Satellites; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.340548
  • Filename
    340548
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1215760