Title :
Comparison Between Different Criteria for Evaluating Reverberation Chamber Functioning Using a 3-D FDTD Algorithm
Author :
Mengue, S. ; Richalot, Elodie ; Picon, Odile
Author_Institution :
Equipe Syst. de Commun., Univ. Paris-Est, Marne-la-Vallee
fDate :
5/1/2008 12:00:00 AM
Abstract :
This paper is devoted to the comparison between different criteria used to evaluate the functioning of a mechanically stirred reverberation chamber. Usual criteria based on power or electric fields are considered, and we also propose a criterion based on the Kolmogorov-Smirnov test, called in this paper ldquosuccess ratio to Kolmogorov-Smirnov testrdquo (SRKS). The SRKS represents the acceptation ratio of this test applied at several points of the working volume, when considering a field component and its associated theoretical distribution. After a presentation of the criteria and of the studied chamber, data issued from 3-D finite-difference time-domain simulations and measurements are used to analyze the chamber functioning by the use of these criteria. This study is performed on a large frequency band, in the lossless case as well as with a lossy chamber, and for several stirrer shapes, to emphasize the influence of these parameters. The comparison of the usual criteria with the SRKS shows the SKRS is an accurate test to estimate the lowest usable frequency of a given reverberation chamber.
Keywords :
finite difference time-domain analysis; reverberation chambers; statistical distributions; 3D FDTD algorithm; Kolmogorov-Smirnov test; finite-difference time-domain method; frequency band; mechanically stirred reverberation chamber; statistical distribution; Analytical models; Electromagnetics; Finite difference methods; Frequency estimation; Resonance; Resonant frequency; Reverberation chamber; Shape; Testing; Time domain analysis; Kolmogorov–Smirnov (KS) test; Kolmogorov--Smirnov (KS) test; lowest usable frequency (LUF); mode-stirred chamber; statistical electromagne-tics;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2008.921049