Title :
SEE in-flight measurement on the MIR orbital station
Author :
Falguère, D. ; Duzellier, S. ; Ecoffet, R.
Author_Institution :
Dept. d´´Etudes et de Recherches en Technol. Spatiale, ONERA-CERT, Toulouse, France
Abstract :
SEE spaceflight measurements are presented on HM65756 SRAM from Matra-MHS, Seeq 28C256 and Motorola MC68020 microprocessor (bulk version) in the MIR station orbit (350 km altitude, 51.6/spl deg/ inclination). Accelerator testing (heavy ion and proton) of flight spares permits the prediction of the event rates using standard model such as CREME and SPACERAD/sup 1/ as well as characterisations of the flight components allowing the comparison of in-orbit observations. Event rate prediction and ground-testing data are compared.<>
Keywords :
SRAM chips; VLSI; aerospace simulation; aerospace testing; electronic engineering computing; ion beam effects; proton beams; proton effects; 350 km; CREME; HM65756 SRAM; MIR orbital station; Matra-MHS; Motorola MC68020 microprocessor; SEE in-flight measurement; SEE spaceflight measurements; SPACERAD; SRAM testing; Seeq 28C256; accelerator testing; aerospace testing; event rate prediction; event rates; flight components; flight spares; ground-testing data; heavy ion; in-orbit observations; ion beam effects; proton; standard model; Circuits; EPROM; Event detection; Extraterrestrial measurements; Ion accelerators; Microprocessors; Proton accelerators; Random access memory; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
