Title :
The single event upset environment for avionics at high latitude
Author :
Sims, A.J. ; Dyer, C.S. ; Peerless, C.L. ; Johansson, K. ; Pettersson, H. ; Farren, J.
Author_Institution :
Dept. of Space & Commun., Defence Res. Agency, Farnborough,, UK
Abstract :
Measurements of the high latitude SEU environment at avionics altitude have been made on board a commercial airliner. Results are compared with models of primary and secondary cosmic rays and atmospheric neutrons. Ground based SEU tests of static RAMs are used to predict rates in flight.<>
Keywords :
SRAM chips; aircraft instrumentation; avionics; cosmic ray interactions; environmental testing; neutron effects; SEU environment; atmospheric neutrons; avionics; commercial airliner; cosmic rays; high latitude; single event upset environment; static RAMs; Aerospace electronics; Atmospheric measurements; Atmospheric modeling; Cosmic rays; Detectors; Energy measurement; Instruments; Neutrons; Single event upset; Space technology;
Journal_Title :
Nuclear Science, IEEE Transactions on
