DocumentCode
1216219
Title
Transient response of ARROW VCSELs
Author
Tee, C.W. ; Yu, S.F. ; Penty, R.V. ; White, I.H.
Author_Institution
Eng. Dept., Cambridge Univ., UK
Volume
41
Issue
2
fYear
2005
Firstpage
140
Lastpage
147
Abstract
The transient response of antiresonant reflecting optical waveguide (ARROW) vertical-cavity surface-emitting lasers (VCSELs) is analyzed. It is found that under current modulation, the radiation loss of the transverse-leaky mode decreases during the state of the lasers but increases during the state. Numerical analysis shows that this variation in radiation loss is due to the carrier-induced refractive-index depression that arises from spatial-hole-burning of carrier concentration. It is noted that the increment in radiation loss during the state can be used to prevent net modal gain of the transverse-leaky mode from reacquiring threshold after turn-off. Hence, a new method to design ARROW, based on the variation in radiation loss, is proposed to eliminate the excitation of secondary pulsation in VCSELs. The influence of thermal lensing effects on the excitation of secondary pulsation during the state of the lasers is also investigated.
Keywords
carrier density; electro-optical modulation; laser cavity resonators; laser modes; optical hole burning; optical losses; refractive index; semiconductor device models; semiconductor lasers; surface emitting lasers; thermal lensing; waveguide lasers; ARROW VCSEL; antiresonant reflecting optical waveguide; carrier concentration; carrier-induced refractive-index depression; current modulation; net modal gain; radiation loss; secondary pulsation excitation; semiconductor laser modeling; spatial-hole-burning; thermal lensing effects; transient response; transverse-leaky mode; turn-off transients; vertical-cavity surface-emitting lasers; Laser excitation; Laser modes; Optical losses; Optical modulation; Optical refraction; Optical waveguides; Surface emitting lasers; Transient response; Vertical cavity surface emitting lasers; Waveguide lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2004.839713
Filename
1386469
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