• DocumentCode
    1216458
  • Title

    Model-based, multiple-fault diagnosis of dynamic, continuous physical devices

  • Author

    Ng, Hwee Tou

  • Author_Institution
    Texas Univ., Austin, TX, USA
  • Volume
    6
  • Issue
    6
  • fYear
    1991
  • Firstpage
    38
  • Lastpage
    43
  • Abstract
    A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter´s algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.<>
  • Keywords
    artificial intelligence; automatic testing; failure analysis; Inc-Diagnose; Qsim qualitative states; continuously changing device states; diagnosis algorithm; diagnosis candidates; multiple-fault diagnosis; physical devices; Circuit faults; Digital circuits; Discrete transforms; Fault detection; Fault diagnosis; Logic devices; Logic testing; Nose; Predictive models; Robustness;
  • fLanguage
    English
  • Journal_Title
    IEEE Expert
  • Publisher
    ieee
  • ISSN
    0885-9000
  • Type

    jour

  • DOI
    10.1109/64.108950
  • Filename
    108950
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1216458