DocumentCode
1216516
Title
Total dose correlation of 4007 devices flown on the CRRES MEP experiment
Author
Zimmerman, D.M. ; Ray, K.P.
Author_Institution
S-Cubed Div., Maxwell Lab., San Diego, CA, USA
Volume
41
Issue
6
fYear
1994
Firstpage
2605
Lastpage
2612
Abstract
This paper considers total dose measurements of six 4007 type devices in the Microelectronics Package (MEP) on board the Combined Release and Radiation Effects Satellite (CRRES). The on-orbit device performance of the 4007 devices is compared to /sup 60/Co ground test data from identical devices. The results show that the low dose rate space data and the higher dose rate /sup 60/Co data agree within a factor of 2.5 for all six 4007 device types.<>
Keywords
CMOS logic circuits; integrated circuit measurement; integrated circuit testing; logic testing; radiation effects; /sup 60/Co ground test; 4007 devices; CRRES MEP experiment; Co; Combined Release/Radiation Effects Satellite; digital ICs; low dose rate space data; microelectronics package; on-orbit device performance; total dose correlation; total dose measurements; Extraterrestrial measurements; Laboratories; Microelectronics; NASA; Orbits; PROM; Packaging; Satellites; Testing; Threshold voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.340621
Filename
340621
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