Title :
A review of fault models for lsi/vlsi devices
Author :
Gai, Silvano ; Mezzalama, Marco ; Prinetto, Paolo
Author_Institution :
Politecnico di Torino, Dipartimento di Automatica ed Informatica, Torino, Italy
fDate :
4/1/1983 12:00:00 AM
Abstract :
The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs
Keywords :
large scale integration; logic testing; LSI; VLSI; bridging faults; fault modelling; fault models; functional faults; microprocessors; stuck-at faults; time-dependent faults;
Journal_Title :
Software & Microsystems
DOI :
10.1049/sm.1983.0016
