• DocumentCode
    1216581
  • Title

    A review of fault models for lsi/vlsi devices

  • Author

    Gai, Silvano ; Mezzalama, Marco ; Prinetto, Paolo

  • Author_Institution
    Politecnico di Torino, Dipartimento di Automatica ed Informatica, Torino, Italy
  • Volume
    2
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    44
  • Lastpage
    53
  • Abstract
    The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs
  • Keywords
    large scale integration; logic testing; LSI; VLSI; bridging faults; fault modelling; fault models; functional faults; microprocessors; stuck-at faults; time-dependent faults;
  • fLanguage
    English
  • Journal_Title
    Software & Microsystems
  • Publisher
    iet
  • ISSN
    0261-3182
  • Type

    jour

  • DOI
    10.1049/sm.1983.0016
  • Filename
    4807931
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1216581