Title :
Silicon based materials and devices 2: Properties and devices [Book Review]
Author_Institution :
Uludag University
fDate :
5/1/2003 12:00:00 AM
Keywords :
Book reviews; Cameras; Materials science and technology; Optical films; Optical materials; Optical refraction; Optical variables control; Semiconductor materials; Silicon compounds; Thin film transistors;
Journal_Title :
Circuits and Devices Magazine, IEEE
DOI :
10.1109/MCD.2003.1203182
