Title :
E-Nose Vapor Identification Based on Dempster–Shafer Fusion of Multiple Classifiers
Author :
Li, Winston ; Leung, Henry ; Kwan, Chiman ; Linnell, Bruce R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB
Abstract :
Electronic noses (e-noses) are commonly used to monitor air contaminants in space stations and shuttles. Data preprocessing (measurement denoising and feature extraction) and pattern classification are important problems of an e-nose system. In this paper, the application of a wavelet-based denoising method and a Dempster-Shafer (DS) classification fusion method in an e-nose system are proposed. Six transient-state features are extracted from the sensor measurements filtered by the wavelet denoising method and are used to train multiple classifiers such as multilayer perceptrons (MLPs), support vector machines (SVMs), k -nearest neighbors (KNNs), and the Parzen classifier. The DS technique is used at the end to fuse the results of the multiple classifiers to get the final classification. Experimental analysis based on real vapor data shows that the wavelet denoising method can successfully remove both random noise and outliers, and the classification rate can be improved by using classifier fusion.
Keywords :
aerospace biophysics; air pollution measurement; contamination; electronic noses; feature extraction; inference mechanisms; multilayer perceptrons; occupational health; occupational safety; pattern classification; random noise; sensor fusion; signal classification; signal denoising; support vector machines; Dempster-Shafer classification fusion method; E-nose vapor identification; Parzen classifier; air contaminants monitoring; astronauts health-and-safety; data preprocessing; electronic noses; gas sensor arrays; gas sensor signals; k -nearest neighbors; measurement denoising; multilayer perceptrons; multiple classifiers; pattern classification; random noise; shuttles; space stations; support vector machines; transient-state feature extraction; wavelet-based denoising method; $k$-nearest neighbor (KNN); $k$-nearest neighbor (KNN); Dempster–Shafer (DS); Dempster??Shafer (DS); Parzen classifier; electronic nose (e-nose); neural network (NN); support vector machine (SVM); wavelet denoising;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.922092