• DocumentCode
    1217437
  • Title

    Coupled noise analysis for adjacent vias in multilayered digital circuits

  • Author

    Gu, Qizheng ; Tassoudji, M. Ali ; Poh, Soon Y. ; Shin, Robert T. ; Kong, Jin Au

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    41
  • Issue
    12
  • fYear
    1994
  • fDate
    12/1/1994 12:00:00 AM
  • Firstpage
    796
  • Lastpage
    804
  • Abstract
    The electromagnetic coupling between two adjacent vias in a multilayered integrated circuit is analyzed by means of equivalent magnetic frill array models incorporated with the even- and odd-mode approach. Closed-form expressions for the coupled noise on the passive via are derived. The coupling responses in the frequency domain and crosstalk waveforms in the time domain for some multilayered via structures are calculated based on these formulas. A 4-layer experimental model is constructed and measurements are taken for the transmission, reflection, and coupling responses. The measurements show good agreement with the calculated results over a frequency range of up to 18 GHz
  • Keywords
    crosstalk; digital integrated circuits; distributed parameter networks; frequency-domain analysis; integrated circuit noise; linear network analysis; time-domain analysis; transmission line theory; 18 GHz; adjacent vias; coupled noise analysis; coupling responses; crosstalk waveforms; electromagnetic coupling; equivalent magnetic frill array models; even-mode approach; frequency domain; multilayered digital circuits; multilayered integrated circuit; odd-mode approach; passive via; reflection response; time domain; transmission response; Circuit analysis; Coupling circuits; Crosstalk; Electromagnetic analysis; Electromagnetic coupling; Integrated circuit modeling; Integrated circuit noise; Magnetic analysis; Magnetic domains; Magnetic noise;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.340842
  • Filename
    340842