DocumentCode :
1217453
Title :
DC small signal symbolic analysis of large analog integrated circuits
Author :
Hsu, Jer-Jaw ; Sechen, Carl
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
41
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
817
Lastpage :
828
Abstract :
This paper presents a new methodology and its implementation (AnalogSifter) for DC small signal fully symbolic analysis of large analog integrated circuits. Our new sifting approach consists of six algorithms designed to relax the circuit size limitation of previously known methods. We show fully symbolic analysis results for much larger circuits than have ever been reported. Very compact symbolic expressions for the DC small signal voltage gains of the 741 and 725 operational amplifiers were obtained in less than 40 CPU seconds on a SUN SPARCstation 2, and the simplified results were numerically within 12% of the exact values. The output is expressed in terms of products of sums which can give the user insight into the behavior of the circuit. The overall time complexity is superquadratic with respect to the number of nodes. The implementation can output simplified symbolic expressions for any desired DC small signal transfer function, including input resistances, output resistances, as well as current and voltage gains. It also provides simplified symbolic expressions for noise analysis, sensitivity analysis, and power supply rejection ratio
Keywords :
analogue integrated circuits; circuit analysis computing; computational complexity; integrated circuit noise; operational amplifiers; sensitivity analysis; signal flow graphs; transfer functions; AnalogSifter; DC small signal symbolic analysis; DC small signal transfer function; SUN SPARCstation 2; current gain; input resistances; large analog integrated circuits; noise analysis; output resistances; power supply rejection ratio; sensitivity analysis; time complexity; voltage gain; Algorithm design and analysis; Analog integrated circuits; Central Processing Unit; Circuit noise; Operational amplifiers; Signal analysis; Signal to noise ratio; Sun; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.340844
Filename :
340844
Link To Document :
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