Study of ion irradiated dielectric layer using network theory

The rapidly developing theory of complex networks indicates that real networks are not random. They have a large-scale architecture, governed by strict organizing principles. Recently, network theory has be en applied on ion track-based electronic structures such as the (TEMPOS (Tunable Electronic Materials with Pores in Oxide on Silicon) structures. In this work, the network theory has be en applied to study the surface properties of TEMPOS structures. The surface properties, i.e., number of pores and their distribution (which ultimately decide the behaviour of the TEMPOS structures) in the dielectric layer on a Si substrate, comes out to be scale-free and governed by the Power-law (power ~ 2).