Title :
A testability measure to improve algebraic test generation
Author :
Lioy, Antonio ; Mezzalama, Marco
Author_Institution :
Politecnico di Torino, Dipartimento di Automatica e Informatica, CAD Group, Torino, Italy
fDate :
4/1/1984 12:00:00 AM
Abstract :
The paper deals with testability measures of digital systems. Specifically, a new algorithm to evaluate testability measures for circuits described in terms of Boolean equations is presented, and its application to speed up (algebraic) test generation for sequential networks is discussed.
Keywords :
fault location; field effect integrated circuits; integrated circuit testing; large scale integration; Boolean equations; algebraic test generation; digital systems; sequential networks; testability measures;
Journal_Title :
Software & Microsystems
DOI :
10.1049/sm.1984.0013
