• DocumentCode
    1217856
  • Title

    Studies in VLSI technology economics. IV. Models for gate array design productivity

  • Author

    Fey, Curt F. ; Paraskevopoulos, Demetris E.

  • Author_Institution
    Xerox Corp., Webster, NY, USA
  • Volume
    24
  • Issue
    4
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1085
  • Lastpage
    1091
  • Abstract
    An empirical model of design productivity is presented and its implications for current and future design are discussed. Model and observed values correlate well (the correlation coefficient is 0.85). The analysis encompasses 70 designs, primarily gate arrays, of up to 25000 gates from five major corporations, designed during 1983-8. The estimate of design productivity enables the determination of normalized productivity, manpower, and schedule. The normalized design productivity adjusts for differences in the design tasks, permitting standardized productivity measurements for planning and for benchmarking
  • Keywords
    VLSI; economics; logic arrays; logic design; VLSI technology economics; benchmarking; correlation coefficient; design productivity; empirical model; gate array design productivity; manpower; normalized productivity; standardized productivity measurements; Circuit testing; Costs; Fabrication; Microelectronics; Monitoring; National electric code; Power generation economics; Productivity; Scheduling; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.34096
  • Filename
    34096