DocumentCode
1217856
Title
Studies in VLSI technology economics. IV. Models for gate array design productivity
Author
Fey, Curt F. ; Paraskevopoulos, Demetris E.
Author_Institution
Xerox Corp., Webster, NY, USA
Volume
24
Issue
4
fYear
1989
fDate
8/1/1989 12:00:00 AM
Firstpage
1085
Lastpage
1091
Abstract
An empirical model of design productivity is presented and its implications for current and future design are discussed. Model and observed values correlate well (the correlation coefficient is 0.85). The analysis encompasses 70 designs, primarily gate arrays, of up to 25000 gates from five major corporations, designed during 1983-8. The estimate of design productivity enables the determination of normalized productivity, manpower, and schedule. The normalized design productivity adjusts for differences in the design tasks, permitting standardized productivity measurements for planning and for benchmarking
Keywords
VLSI; economics; logic arrays; logic design; VLSI technology economics; benchmarking; correlation coefficient; design productivity; empirical model; gate array design productivity; manpower; normalized productivity; standardized productivity measurements; Circuit testing; Costs; Fabrication; Microelectronics; Monitoring; National electric code; Power generation economics; Productivity; Scheduling; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.34096
Filename
34096
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