DocumentCode :
1217880
Title :
R-βR ladder networks for the design of high-accuracy static analog memories
Author :
Scandurra, Graziella ; Ciofi, Carmine
Author_Institution :
INFM & the Dipt. di Fisica della Materia e Tecnologie Fisiche Avanzate, Univ. of Messina, Italy
Volume :
50
Issue :
5
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
605
Lastpage :
612
Abstract :
In this paper, we show that the topology of successive approximation analog-to-digital converters can be used for the realization of a static analog memory (SAM), that is a circuit capable of indefinitely maintaining at its output a voltage close to the one presented at its input for a limited time. After demonstrating that the accuracy which can be obtained in the storage process is limited by the maximum positive value of the differential nonlinearity of the digital-to-analog converter (DAC) used as part of the circuit, we demonstrate that by means of a proper choice of the ratio of the resistances of the ladder network of the DAC, very high accuracy can be obtained even by employing poor tolerance resistors, without the need for any trimming or calibration step. This fact might be advantageously exploited for the design of integrated multichannel SAMs which, employed in connection with a single high-accuracy DAC, could allow the realization of multiple output, high-accuracy, programmable voltage or current sources.
Keywords :
analogue storage; analogue-digital conversion; digital-analogue conversion; ladder networks; network topology; programmable circuits; sample and hold circuits; tolerance analysis; ADC topology; DAC differential nonlinearity; R-βR ladder networks; high-accuracy static analog memories; integrated multichannel SAMs; ladder network resistances; maximum positive value; multiple output high-accuracy programmable current sources; multiple output high-accuracy programmable voltage sources; poor tolerance resistors; sample-and-hold circuits; successive approximation analog-to-digital converters; tolerance analysis; Analog memory; Analog-digital conversion; Calibration; Circuit topology; Costs; Digital-analog conversion; Network topology; Resistors; Tolerance analysis; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/TCSI.2003.811016
Filename :
1203820
Link To Document :
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