New spatial-temporal patterns and the first programmable on-chip bifurcation test bed

Author

Petrás, István ; Roska, Tamás ; Chua, Leon O.

Author_Institution

Analogical & Neural Comput. Lab., Hungarian Acad. of Sci., Budapest, Hungary

Volume

50

Issue

5

fYear

2003

fDate

5/1/2003 12:00:00 AM

Firstpage

619

Lastpage

633

Abstract

In this paper, we introduce a new experimental tool, a real-time programmable, spatial-temporal bifurcation test bed. We present the experimental analysis of an antisymmetric template class. This class produces novel spatial-temporal patterns that exhibit complex dynamics. The character of these propagating patterns depends on the self-feedback and on the sign of the coupling below the self-feedback template element.

Keywords

analogue processing circuits; bifurcation; chaos; circuit feedback; nonlinear network analysis; pattern formation; programmable circuits; spatiotemporal phenomena; antisymmetric template class; cellular nonlinear networks; chaos; complex dynamics; coupling sign; programmable on-chip bifurcation test bed; propagating patterns; real-time programmable spatial-temporal bifurcation test bed; self-feedback; self-feedback template element; spatial-temporal patterns; Automation; Bifurcation; Cellular networks; Cellular neural networks; Chaos; Circuit testing; Laboratories; Life testing; Pattern formation; Two dimensional displays;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/TCSI.2003.811022

Filename

1203822