Title :
Development of an S-band 50-kW-Average-Power Klystron
Author :
Zhang, Zhaochuan ; Ding, Yaogen ; Fan, Junjie ; Guo, Yanfang ; Zhang, Yuwen ; Shen, Bin ; Fu, Chunjiu ; Fan, Xudong
Author_Institution :
Inst. of Electron., Chinese Acad. of Sci., Beijing
fDate :
5/1/2009 12:00:00 AM
Abstract :
This paper reports the design considerations, simulation results, and test results of an S-band 70-MHz-instantaneous-bandwidth 50-kW-average-power klystron, which was developed by the Institute of Electronics, Chinese Academy of Sciences, from January 2004 to August 2007. The typical result is a 50-kW average output power with an 89-mus RF pulsewidth and a 300-Hz repetition rate during 8 h of continuous reliability testing. A cracked output window is also discussed.
Keywords :
cracks; electron device testing; klystrons; reliability; S-band; bandwidth 70 MHz; crack of alumina disk; frequency 300 Hz; klystrons; power 50 kW; reliability testing; time 8 h; Cathodes; Coils; Current density; Electronic equipment testing; Electrons; Klystrons; Magnetic fields; Radio frequency; Superconducting microwave devices; Thermal stresses; Crack of alumina disk; design considerations; klystron; simulation results; test results;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2009.2015417
