DocumentCode
1218116
Title
Vacuum Arc Plasma Centrfuge for Element and Isotope Separation
Author
Geva, M. ; Cohen, C. ; Danziger, O. ; Dothan, F. ; Friedland, L. ; Levin, L.A. ; Maharshak, S. ; Hirshfield, J.L.
Volume
15
Issue
5
fYear
1987
Firstpage
583
Lastpage
588
Abstract
Vacuum arcs have been studied extensively in the past several decades with applications primarily in the areas of switching, vacuum remelting, and vapor deposition. Application of the vacuum arc for element and isotope separation has been studied recently and is reviewed in this paper. An arc was produced in a 30-cm-diameter 4-m-long cylindrical chamber with coaxially mounted electromagnets providing a 2.6-m-long constant axial magnetic field of up to 6 kG. The vacuum discharge between a solid cathode and a mesh anode was triggered electrically. A pulse-forming network (PFN) of 70-m¿ impedance provided nearly constant-current discharge pulses of several kiloamps and 6-12-ms duration. The magnetized plasma column, flowing axially from the anode with a typical velocity of 106 cm/s, rotated nearly as a solid body. This rotation was due to the E à B drift, produced by the axial magnetic field and the radial electric field across the column. A typical rotation frequency was 105 rad/s. The centrifugal effect due to the rotation caused a radial redistribution of ions within the plasma column, thereby producing elemental and isotope enrichment. The separation was observed to increase exponentially with the square of the radius. Enrichments of up to 300 percent were measured in a Cu-Zn plasma. The radial plasma density profile was found to be roughly Gaussian, with central electron densities of about 1013 cm-3. The radial potential profile across the column was measured and found to be parabolic with radius.
Keywords
Anodes; Chemical elements; Chemical vapor deposition; Isotopes; Magnetic fields; Plasma applications; Plasma density; Plasma measurements; Solids; Vacuum arcs;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.1987.4316757
Filename
4316757
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