• DocumentCode
    1218146
  • Title

    Flux transfer devices

  • Author

    Harada, Yutaka ; Hioe, Willy ; Goto, Eiichi

  • Author_Institution
    ERATO/JRDC, Tokyo, Japan
  • Volume
    77
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1280
  • Lastpage
    1286
  • Abstract
    Flux transfer device theory is reviewed. In such devices, generalized magnetic flux, defined as the time integral of voltage, is used to describe the device characteristics. The Josephson junction and inductor are the main circuit elements in flux transfer devices, because they maintain a constant value for the time integral of voltage. Flux transfer devices are based on either an RF SQUID (superconducting quantum interference device) or a fluxon device. Four devices, including the parametric quantron and the quantum flux parametron, are reviewed as applications of the RF SQUID. The fluxon feedback oscillator and a soliton device are also reviewed as applications of fluxon devices. The quantum flux parametron is then described. The parametron principle and the fundamental properties of the quantum flux parametron such as gain, switching speed, and power dissipation are discussed. Logic circuits and a memory cell are also reviewed. A novel analog-to-digital converter is proposed as an application of the quantum flux parametron
  • Keywords
    SQUIDs; analogue-digital conversion; microwave parametric oscillators; reviews; superconducting junction devices; superconducting logic circuits; superconducting memory circuits; Josephson junction; RF SQUID; analog-to-digital converter; flux transfer devices; fluxon device; fluxon feedback oscillator; gain; inductor; logic circuit; memory cell; parametric quantron; power dissipation; quantum flux parametron; soliton device; superconducting quantum interference device; switching speed; time integral of voltage; Circuits; Feedback; Inductors; Josephson junctions; Magnetic flux; Radio frequency; Radiofrequency interference; SQUIDs; Superconducting devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.34126
  • Filename
    34126