DocumentCode :
1218182
Title :
Background Calibration of Pipelined ADCs Via Decision Boundary Gap Estimation
Author :
Brooks, Lane ; Lee, Hae-Seung
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA
Volume :
55
Issue :
10
fYear :
2008
Firstpage :
2969
Lastpage :
2979
Abstract :
A method of indirect background digital calibration of the dominant static nonlinearities in pipelined analog-to-digital converters (ADC) is presented. The method, called decision boundary gap estimation (DBGE), monitors the output of the ADC to estimate the size of code gaps that result at the decision boundaries of each stage. Code gaps result from such effects as capacitor mismatch, finite opamp gain, finite current source output impedance, comparator offset, and charge injection. DBGE does not require special calibration signals or additional analog hardware and can even reduce the performance requirements of the analog circuitry. The calibration is performed using the input signal and thus requires that the input signal exercise the codes in the vicinity of the decision boundaries of each stage. If it does not exercise these codes, then lack of calibration is less critical because the nonlinearities will not appear in the output signal. DBGE is simple and amenable to hardware and/or software implementations. Simulation results indicate DBGE is highly accurate, robust, and adaptive even in the presence of parameter drift and circuit noise.
Keywords :
analogue-digital conversion; calibration; circuit noise; analog circuitry; analog-to-digital converter; capacitor mismatch effect; circuit noise; decision boundary gap estimation; indirect background digital calibration; parameter drift; Adaptive digital background calibration; adaptive digital background calibration; capacitor mismatch; finite opamp gain; pipelined analog-to-digital converter (ADC); static non-linearity; static nonlinearity;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.925373
Filename :
4519952
Link To Document :
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