Title :
XPS study of sodium in Bridgman-grown CuInSe2+x
Author :
Sunyoung Park ; Champness, Clifford H. ; Ishiang Shih
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
XPS measurements were made on Bridgman-grown crystalline ingots obtained from melts of composition CuInSe2+x plus [Na] atomic amounts of elementary sodium, where [Na] ranged from 0 to 6 % and x ranged from 0 to 0.2. It was found that the added Na located itself in a surface layer about 0.2 micron thick and none was detected in the interior of the ingot. For material with and without added Na, copper was found to be depleted at the surface below its proportion deep into the bulk. However, this surface lowering was accentuated with increased added Na up to about 1 at. %, which also increased the surface [Se] proportion for bulk p-type material.
Keywords :
X-ray photoelectron spectra; copper compounds; crystal growth from melt; crystal structure; indium compounds; ingots; semiconductor growth; ternary semiconductors; Bridgman-grown crystalline ingots; CuInSe2+x; XPS; atomic elementary sodium amounts; bulk p-type material; melt composition; surface lowering; surface proportion; Atomic measurements; Compounds; Copper; Materials; Photovoltaic cells; Surface treatment; X-ray scattering; Bridgman growth; XPS; copper indium diselenide; sodium;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925242
