• DocumentCode
    1218789
  • Title

    Analysis of Solder Joint Failure Criteria and Measurement Techniques in the Qualification of Electronic Products

  • Author

    Qi, Haiyu ; Vichare, Nikhil M. ; Azarian, Michael H. ; Pecht, Michael

  • Author_Institution
    Dell, Inc., Round Rock, TX
  • Volume
    31
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    469
  • Lastpage
    477
  • Abstract
    The specification of a failure criterion for solder joints is an important element in the qualification of an electronic product. A common approach to reliability testing is to monitor electrical resistance during the testing. The techniques employed for resistance monitoring and data acquisition will determine whether information regarding transients or long-term drift is captured by the measurement. This paper reviews and assesses the failure criteria used in industry and academia, focusing on three key attributes: resistance threshold, duration of resistance change, and frequency of changes. An experimental study on thermomechanical fatigue of ball grid array package solder joints was performed to compare measurement techniques and failure criteria.
  • Keywords
    ball grid arrays; electric resistance measurement; failure analysis; fatigue testing; life testing; solders; accelerated testing; ball grid array; data acquisition; electrical resistance monitoring; electronic product qualification; life testing; reliability testing; resistance change; resistance threshold; solder joint failure criteria; thermomechanical fatigue; Accelerated testing; ball grid array (BGA); interconnects; reliability; solder;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2008.921647
  • Filename
    4520017