Measurement of digital noise in mixed-signal integrated circuits

Author

Makie-Fukuda, Keiko ; Kikuchi, Takafumi ; Matsuura, Tatsuji ; Hotta, Masao

Author_Institution

Central Res. Lab., Hitachi Ltd., Tokyo, Japan

Volume

30

Issue

2

fYear

1995

fDate

2/1/1995 12:00:00 AM

Firstpage

87

Lastpage

92

Abstract

This paper proposes a method of measuring the influence of digital noise on analog circuits using wide-band voltage comparators as noise detectors. Noise amplitude and r.m.s voltage are successfully measured by this method. A test chip is fabricated to measure the digital noise influence. From the experimental results, it is shown that the digital noise influence can be considerably reduced by using a differential configuration in analog circuits for mixed-signal IC´s. The digital noise influence can be further reduced by lowering the digital supply voltage. These results show that the voltage-comparator-based measuring method is effective in measuring the influence of digital noise on analog circuits

Keywords

comparators (circuits); electric noise measurement; integrated circuit measurement; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; RMS voltage; analog circuits; differential configuration; digital noise measurement; digital supply voltage reduction; mixed-signal IC; mixed-signal integrated circuits; noise amplitude; noise detectors; wideband voltage comparators; Analog circuits; Circuit noise; Integrated circuit measurements; Integrated circuit noise; Mixed analog digital integrated circuits; Noise measurement; Noise reduction; Semiconductor device measurement; Voltage; Wideband;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.341734

Filename

341734