DocumentCode :
121883
Title :
The CdS/CdTe solar cell protected by ITO/Mo bilayer at improved back contact
Author :
Rejon, Victor ; Riech, Ines ; Hernandez-Rodriguez, E. ; Quintana, P. ; Pena, Juan Luis
Author_Institution :
Appl. Phys. Dept., CINVESTAV-IPN, Merida, Mexico
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1696
Lastpage :
1698
Abstract :
In this work CdS/CdTe solar cell that uses a Mo thin film as a back contact on last layer was protected against MoOx formation and scratching by using an ITO thin film. The back contact was fabricated by using Cu/Mo and Cu/Mo/ITO. The Cu layer was used to form CuxTe onto CdTe film. The films Cu, Mo and ITO were deposited by rf-sputtering. The cell efficiency is degraded when it is annealed at 400 °C in air. We show evidences that the p-n junction remains good and the oxidation of Mo is the main cause of the cell efficiency degradation. Also we show that the ITO thin film deposited onto Mo avoid the MoOx formation when the solar cell is annealed at same conditions. All solar cell characteristics are preserved. The solar cells were fabricated in the superstrate configuration by using Glass/ITO/ZnO/CdS/CdTe/back contact layers. The CdTe film was grown by conventional CSS technique. The cells were activated by using CHClF2-argon-oxygen gases. DRX spectra and HR-SEM were made for Mo/Glass and ITO/Mo/CdTe before and after annealing at 400 °C in air.
Keywords :
argon; cadmium compounds; carbon compounds; chlorine compounds; glass; indium compounds; molybdenum compounds; oxygen; p-n junctions; scanning electron microscopy; solar cells; sputtering; thin film devices; tin compounds; zinc compounds; CHClF2-Ar-O; CSS technique; Cu-Mo-ITO; CuxTe; DRX spectra; HR-SEM; ITO-ZnO-CdS-CdTe; annealing; cell efficiency degradation; glass back contact layers; p-n junction; rf-sputtering; solar cell characteristics; superstrate configuration; temperature 400 degC; thin film; Annealing; Indexes; Indium tin oxide; Zinc oxide; Activation process; Back contact; CdS/CdTe solar cells; ITO/Mo bilayer; annealing process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925247
Filename :
6925247
Link To Document :
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