Title :
A high temperature precision amplifier
Author :
Finvers, Ivars G. ; Haslett, J.W. ; Trofimenkoff, F.N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
fDate :
2/1/1995 12:00:00 AM
Abstract :
A precision operational amplifier has been developed for instrumentation applications in which the circuitry must operate in ambient temperatures as high as 200°C. At 200°C the amplifier maintains an input offset voltage and current of less than 200 μV and 1 nA respectively, a gain bandwidth product of 2.2 MHz, and a slew rate of 5.4 V/μS. The amplifier is fabricated in a standard CMOS process and consumes 5.5 mW of power at a supply voltage of 5 V. A continuous time auto-zeroed amplifier topology is used to achieve the low offset voltage levels. At high temperatures the leakage currents of the sample and hold switches used to achieve auto-zeroing, degrading the offset correction voltages stored on the hold capacitors. This degradation is reduced by using large external hold capacitors and by minimizing the diffusion area of the switches through the use of a doughnut shaped layout. The effect of the voltage degradation is reduced by sensing the offset correction voltage with a low sensitivity differential auxiliary input stage. A new input switch topology is used to reduce the amplifier´s input offset current at high temperatures
Keywords :
CMOS analogue integrated circuits; instrumentation amplifiers; leakage currents; operational amplifiers; 1 nA; 200 C; 200 muV; 5 V; 5.5 W; CMOS op amp; CMOS process; continuous time auto-zeroed amplifier topology; differential auxiliary input stage; doughnut shaped layout; high temperature precision amplifier; hold capacitors; input offset current reduction; input switch topology; instrumentation applications; low offset voltage levels; offset correction voltages; operational amplifier; voltage degradation; Bandwidth; Capacitors; Circuits; Degradation; Instruments; Low voltage; Operational amplifiers; Switches; Temperature; Topology;
Journal_Title :
Solid-State Circuits, IEEE Journal of