• DocumentCode
    1218843
  • Title

    A high temperature precision amplifier

  • Author

    Finvers, Ivars G. ; Haslett, J.W. ; Trofimenkoff, F.N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
  • Volume
    30
  • Issue
    2
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    120
  • Lastpage
    128
  • Abstract
    A precision operational amplifier has been developed for instrumentation applications in which the circuitry must operate in ambient temperatures as high as 200°C. At 200°C the amplifier maintains an input offset voltage and current of less than 200 μV and 1 nA respectively, a gain bandwidth product of 2.2 MHz, and a slew rate of 5.4 V/μS. The amplifier is fabricated in a standard CMOS process and consumes 5.5 mW of power at a supply voltage of 5 V. A continuous time auto-zeroed amplifier topology is used to achieve the low offset voltage levels. At high temperatures the leakage currents of the sample and hold switches used to achieve auto-zeroing, degrading the offset correction voltages stored on the hold capacitors. This degradation is reduced by using large external hold capacitors and by minimizing the diffusion area of the switches through the use of a doughnut shaped layout. The effect of the voltage degradation is reduced by sensing the offset correction voltage with a low sensitivity differential auxiliary input stage. A new input switch topology is used to reduce the amplifier´s input offset current at high temperatures
  • Keywords
    CMOS analogue integrated circuits; instrumentation amplifiers; leakage currents; operational amplifiers; 1 nA; 200 C; 200 muV; 5 V; 5.5 W; CMOS op amp; CMOS process; continuous time auto-zeroed amplifier topology; differential auxiliary input stage; doughnut shaped layout; high temperature precision amplifier; hold capacitors; input offset current reduction; input switch topology; instrumentation applications; low offset voltage levels; offset correction voltages; operational amplifier; voltage degradation; Bandwidth; Capacitors; Circuits; Degradation; Instruments; Low voltage; Operational amplifiers; Switches; Temperature; Topology;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.341738
  • Filename
    341738