DocumentCode
121897
Title
Spray pyrolysis of semi-transparent backwall superstrate CuIn(S,Se)2 solar cells
Author
Zhaoning Song ; Phillips, Adam B. ; Krantz, Patrick W. ; Khanal, Rajendra R. ; Heben, Michael J.
Author_Institution
Dept. of Phys. & Astron., Univ. of Toledo, Toledo, OH, USA
fYear
2014
fDate
8-13 June 2014
Firstpage
1712
Lastpage
1717
Abstract
We explored the feasibility of depositing CuIn(S,Se)2 (CIS) absorbers using a recently developed hydrazine-based spray pyrolysis method in the backwall superstrate configuration. The devices were fabricated in a novel configuration consisting of a solution-processed CIS/CdS p-n junction sandwiched between two transparent conducting layers and photovoltaic responses was demonstrated with illumination through either side of the device. The structural, compositional, and electrical properties of the devices were investigated. The current voltage characteristics and quantum efficiency of the backwall superstrate and conventional substrate devices were studied. The performance of the backwall superstrate devices was less than that of the control devices due to the relatively thick absorber thickness and high sheet resistance of the transparent back contact. Further improvement in the crystal quality and stoichiometry of CIS deposition should lead to high efficiency devices with thinner and better quality absorbers.
Keywords
copper compounds; indium compounds; p-n heterojunctions; pyrolysis; solar cells; sulphur compounds; CuInSSe2; backwall superstrate configuration; backwall superstrate solar cells; crystal quality; current voltage characteristics; electrical property; p-n junction; photovoltaic responses; quantum efficiency; semi-transparent solar cells; spray pyrolysis method; stoichiometry; transparent back contact; Lighting; Photovoltaic cells; Substrates; Thickness measurement; Zinc oxide; copper indium diselenide; hydrazine; photovoltaic cells; solution-based process; spray pyrolysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925251
Filename
6925251
Link To Document