DocumentCode :
121934
Title :
Increased radiation hardness in ultra-thin GaAs single-junction solar cells
Author :
Becker, Jurgen ; Ying-Shen Kuo ; Yong-Hang Zhang
Author_Institution :
Center for Photonics Innovation & Sch. of Electr., Arizona State Univ., Tempe, AZ, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1839
Lastpage :
1841
Abstract :
The absorber-thickness dependent, relative efficiency losses for solar cells with a 300 nm, 1000 nm and 2000 nm thick absorber were found to be 20.5%, 26.8% and 28.6%, respectively, after exposure to 1 MeV electron radiation. Thinner solar cells exhibited smaller efficiency losses than thicker devices; a trend that correlates well with the theoretical prediction using a semi-analytical model.
Keywords :
III-V semiconductors; electron radiation; gallium arsenide; solar absorber-convertors; solar cells; GaAs; absorber-thickness; electron radiation; electron volt energy 1 MeV; radiation hardness; semianalytical model; size 1000 nm; size 2000 nm; size 300 nm; ultra-thin single-junction solar cells; Charge carrier lifetime; Degradation; Gallium arsenide; Photovoltaic cells; Radiation effects; Radiative recombination; GaAs; Radiation Hardness; Solar Cell; Space Applications; Thin-Film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925281
Filename :
6925281
Link To Document :
بازگشت