• DocumentCode
    121949
  • Title

    Afterpulse background suppression in time-correlated single photon counting lifetime experiments using optimized gate filter

  • Author

    Gerber, Martin ; Kleiman, Rafael

  • Author_Institution
    McMaster Univ., Hamilton, ON, Canada
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1899
  • Lastpage
    1902
  • Abstract
    Using a monostable multivibrator, the signal-dependent afterpulsing background from a single photon avalanche diode was suppressed. This digital filter gate was characterized and optimized using photoluminescence decay lifetime measurements to show a reduction in systematic error that is 25% of the measured lifetime and ~500X improvement in acquisition time when compared with the time taken to obtain a comparably reliable result by reduction of the repetition rate to suppress afterpulsing. At 10 MHz, there is an increase in the linear dynamic range from ~2τ to ~6τ, where the lifetime, t, was measured to be (5.0±0.1)ns. Lifetime measurements were performed with a pulsed 510 nm diode laser, a 500 nm GaAs layer (sandwiched between InGaP capping layers), a silicon single-photon avalanche photodiode and time-correlated single photon counting electronics.
  • Keywords
    III-V semiconductors; avalanche photodiodes; digital filters; elemental semiconductors; interference suppression; multivibrators; photoluminescence; digital filter gate optimization; gallium arsenide layer; indium gallium phosphide capping layers; lifetime measurements; monostable multivibrator; photoluminescence decay lifetime measurements; signal-dependent afterpulse background suppression; single photon avalanche photodiode; time-correlated single photon counting electronics; time-correlated single photon counting lifetime experiments; Logic gates; Measurement uncertainty; Photonics; Photovoltaic systems; Semiconductor device measurement; Systematics; Time measurement; charge carrier lifetime; charge carrier processes; filtering; photoluminescence; photovoltaic cells; semiconductor detectors; solar energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925296
  • Filename
    6925296