Title :
Analysis of leakage properties of periodic dielectric image guides
Author :
Matsumoto, Morio
Author_Institution :
Dept. of Commun. Eng., Osaka Univ., Japan
Abstract :
The leakage properties of dielectric image guides with periodic surface corrugations on their top or side walls are analysed. A finite-element method in conjunction with an improved perturbation technique is employed to calculate numerically the leakage constant of the lowest-order Ey11 mode.
Keywords :
dielectric waveguides; finite element analysis; waveguide theory; finite-element method; leakage constant; leakage properties; lowest-order mode; periodic dielectric image guides; periodic surface corrugations; perturbation technique; side walls;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19891053
