• DocumentCode
    1219766
  • Title

    Vacuum-insulated-gate field-effect transistor

  • Author

    Huang, Jie ; Howe, R.T. ; Lee, Hae-Seung

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    25
  • Issue
    23
  • fYear
    1989
  • Firstpage
    1571
  • Lastpage
    1573
  • Abstract
    A vacuum-insulated-gate field-effect transistor (VIGFET) is fabricated using a modified polysilicon-gate MOS process. The vacuum insulation is formed by first selectively etching the initial SiO2 layer under the polysilicon gate in HF and then depositing LPCVD SiO2 (LTO) to seal the evacuated cavity under the gate. Initial measurements of n-channel FET drain characteristics result in an effective value for the channel-electron mobility*gate capacitance product of k´= mu nC´=21 mu A V-2, comparable to that of conventional MOSFETs.
  • Keywords
    carrier mobility; chemical vapour deposition; etching; insulated gate field effect transistors; LPCVD; Si-SiO 2; VIGFET; channel-electron mobility; gate capacitance; modified polysilicon-gate MOS process; n-channel FET drain characteristics; selectively etching; vacuum insulation; vacuum-insulated-gate field-effect transistor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19891055
  • Filename
    138799