DocumentCode
1219766
Title
Vacuum-insulated-gate field-effect transistor
Author
Huang, Jie ; Howe, R.T. ; Lee, Hae-Seung
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume
25
Issue
23
fYear
1989
Firstpage
1571
Lastpage
1573
Abstract
A vacuum-insulated-gate field-effect transistor (VIGFET) is fabricated using a modified polysilicon-gate MOS process. The vacuum insulation is formed by first selectively etching the initial SiO2 layer under the polysilicon gate in HF and then depositing LPCVD SiO2 (LTO) to seal the evacuated cavity under the gate. Initial measurements of n-channel FET drain characteristics result in an effective value for the channel-electron mobility*gate capacitance product of k´= mu nC´=21 mu A V-2, comparable to that of conventional MOSFETs.
Keywords
carrier mobility; chemical vapour deposition; etching; insulated gate field effect transistors; LPCVD; Si-SiO 2; VIGFET; channel-electron mobility; gate capacitance; modified polysilicon-gate MOS process; n-channel FET drain characteristics; selectively etching; vacuum insulation; vacuum-insulated-gate field-effect transistor;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19891055
Filename
138799
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