DocumentCode
1219780
Title
Fault diagnosis of RAMs from random testing experiments
Author
David, René ; Fuentes, Antoine
Author_Institution
Lab. d´´Autom. de Grenoble, Inst. Nat. Polytech. de Grenoble, Saint-Martin-d´´Heres, France
Volume
39
Issue
2
fYear
1990
fDate
2/1/1990 12:00:00 AM
Firstpage
220
Lastpage
229
Abstract
It is shown how random testing experiments can be used for fault diagnosis. Starting from a prescribed set of faults, the result of the first experiment allows the authors (1) to determine a subset of faults which are compatible with this result and (2) to choose the second experiment, and so on. An algorithm (each step of which is an experiment) is given, and simulation results are presented
Keywords
fault location; random-access storage; RAM; fault diagnosis; random testing experiments; simulation results; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Helium; Manufacturing; Production; Read-write memory;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.45207
Filename
45207
Link To Document