DocumentCode :
1219866
Title :
Fault tolerance in linear systolic arrays using time redundancy
Author :
Majumdar, A. ; Raghavendra, C.S. ; Breuer, M.A.
Author_Institution :
Dept. of Electr. Eng.-Syst., Univ. of Southern California, Los Angeles, CA, USA
Volume :
39
Issue :
2
fYear :
1990
fDate :
2/1/1990 12:00:00 AM
Firstpage :
269
Lastpage :
276
Abstract :
A linear systolic array with fault-tolerant capabilities is described. Fault tolerance is achieved by using triple time redundancy. The array is capable of undergoing reconfiguration and can operate in a gracefully degradable mode. The concept of algorithm remapping on degraded (smaller) arrays is integrated with that of graceful degradation to obtain a general fault-tolerance technique. A new technique for restructuring algorithms and executing them on a degraded array is discussed. The requisite modifications of the interconnection, switching, and control structures to achieve fault tolerance are discussed. Reliability analysis of the system is carried out, and the reliability is compared to that of nonredundant systolic arrays. Finally, the average performance of the system, with running time and throughput as performance metrics, is estimated
Keywords :
cellular arrays; fault tolerant computing; logic testing; control structures; fault-tolerant capabilities; gracefully degradable mode; interconnection; linear systolic arrays; performance metrics; reconfiguration; reliability analysis; running time; switching; throughput; triple time redundancy; Computer architecture; Degradation; Fault tolerance; Hardware; Measurement; Redundancy; Signal processing algorithms; Switches; Systolic arrays; Throughput;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.45214
Filename :
45214
Link To Document :
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