• DocumentCode
    1219896
  • Title

    Comments on "Signature analysis for multiple output circuits" by R. David

  • Author

    David, René

  • Author_Institution
    Lab. d´´Autom. de Grenoble, Inst. Nat. Polytech., Saint-Martin-d´´Heres, France
  • Volume
    39
  • Issue
    2
  • fYear
    1990
  • Firstpage
    287
  • Lastpage
    288
  • Abstract
    The probability of a fault-free signature has been calculated in the above-named paper (see ibid., vol.C-35, no.9, p.830-7 (1986)) and in an earlier paper by the same author (see ibid., vol.C-29, no.7, p.668-73 (1980)). Implicitly, it was considered as the probability of masking due to signature analysis. It is shown here that this does not correspond exactly to the probability of aliasing. A new definition is given. The difference centers on the event where there are no bit errors in the data to be compressed. When the response of the circuit is correct, the signature is fault-free. However, there is no aliasing.<>
  • Keywords
    logic testing; fault-free signature; multiple output circuits; signature analysis; Boolean functions; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Electrons; Fourier transforms; Harmonic analysis; Logic circuits; Probability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.45217
  • Filename
    45217