DocumentCode
1219896
Title
Comments on "Signature analysis for multiple output circuits" by R. David
Author
David, René
Author_Institution
Lab. d´´Autom. de Grenoble, Inst. Nat. Polytech., Saint-Martin-d´´Heres, France
Volume
39
Issue
2
fYear
1990
Firstpage
287
Lastpage
288
Abstract
The probability of a fault-free signature has been calculated in the above-named paper (see ibid., vol.C-35, no.9, p.830-7 (1986)) and in an earlier paper by the same author (see ibid., vol.C-29, no.7, p.668-73 (1980)). Implicitly, it was considered as the probability of masking due to signature analysis. It is shown here that this does not correspond exactly to the probability of aliasing. A new definition is given. The difference centers on the event where there are no bit errors in the data to be compressed. When the response of the circuit is correct, the signature is fault-free. However, there is no aliasing.<>
Keywords
logic testing; fault-free signature; multiple output circuits; signature analysis; Boolean functions; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Electrons; Fourier transforms; Harmonic analysis; Logic circuits; Probability;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.45217
Filename
45217
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