DocumentCode :
1220533
Title :
Time-constrained failure diagnosis in distributed embedded systems: application to actuator diagnosis
Author :
Kandasamy, Nagarajan ; Hayes, John P. ; Murray, Brian T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Volume :
16
Issue :
3
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
258
Lastpage :
270
Abstract :
Advanced automotive control applications such as steer-by-wire are typically implemented as distributed systems comprising many embedded processors, sensors, and actuators interacting via a communication bus. They have severe cost constraints, but demand a high level of safety and performance. Motivated by the need for timely diagnosis of faulty actuators in such systems, we present a method to achieve distributed failure diagnosis under deadline and resource constraints. Actuators are diagnosed in distributed fashion by processors to provide a global view of their fault status. The integration of software-based tests for actuator diagnosis within the overall control application is studied. These tests are implemented using analytical redundancy and execute concurrently with the control tasks. The test scheduling problem is then formulated and solved to guarantee actuator diagnosis within designer-specified deadlines while meeting control performance goals. As a secondary objective, the scheduling algorithm also reduces the number of processors required for diagnosis. We demonstrate the practicality of the proposed diagnosis approach by applying it to a steer-by-wire example to identify failed actuators in timely fashion.
Keywords :
actuators; automotive engineering; embedded systems; failure analysis; fault diagnosis; scheduling; system recovery; task analysis; actuator diagnosis; automotive control application; communication bus; distributed embedded system; embedded processor; resource constraints; software-based test; test scheduling problem; time-constrained failure diagnosis; Actuators; Automotive engineering; Communication system control; Control systems; Costs; Embedded system; Fault diagnosis; Safety; Sensor systems and applications; Testing;
fLanguage :
English
Journal_Title :
Parallel and Distributed Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1045-9219
Type :
jour
DOI :
10.1109/TPDS.2005.37
Filename :
1388215
Link To Document :
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