• DocumentCode
    122063
  • Title

    Valence band offset at MoO3/CdTe interface probed by X-ray photoelectron spectroscopy

  • Author

    Paudel, Naba R. ; Yan, Y.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Toledo, Toledo, OH, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2397
  • Lastpage
    2399
  • Abstract
    CdTe-based thin-film solar cells fabricated with Cu-free MoO3/Au back contacts have achieved cell efficiencies as high as 14%. The incorporation of MoO3 buffer layers improves the open circuit voltage but reduces the fill factor (FF) of the CdTe cells compared to the cells using Au-only contacts. X-ray photoelectron spectroscopy measurements suggest a 2.75±0.20 eV valence band offset (VBO) between CdTe and MoO3. Such a large VBO explains the decrease in FF with the increase of the thickness of the MoO3 buffer layer.
  • Keywords
    II-VI semiconductors; X-ray photoelectron spectra; buffer layers; cadmium compounds; gold; molybdenum compounds; semiconductor thin films; solar cells; valence bands; wide band gap semiconductors; Au-MoO3-CdTe-CdS; X-ray photoelectron spectroscopy; back contacts; buffer layer thickness; cell efficiencies; fill factor; open circuit voltage; thin-film solar cells; valence band offset; Commercialization; Oxidation; Spectroscopy; CdTe; Cu-free; MoO3; VBO; XPS; back contact; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925410
  • Filename
    6925410