DocumentCode :
122064
Title :
Thin film Iron Pyrite synthesized by sulfurization of Iron Oxide for application in photovoltaics
Author :
Rajbhandari, Pravakar P. ; Dhakal, Tara P. ; Westgate, Charles R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Center for Autonomous Solar Power (CASP), Binghamton Univ., Binghamton, NY, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2400
Lastpage :
2403
Abstract :
Iron Pyrite (FeS2) is considered as a promising candidate for photovoltaic application because of its suitable band-gap, very high light absorption coefficient and the abundance of the component elements in the earth´s crust. The problem however is that Iron Sulfide has several coexisting phases. Even with the same stoichiometry, it may have two different phases such as pyrite and marcasite. In this report, a phase pure iron pyrite is fabricated on a plain glass and molybdenum coated glass in an atmospheric pressure chemical vapor deposition system (APCVD) by annealing sputtered iron oxide (Fe2O3) in sulfur environment (elemental sulfur) at temperatures higher than 350°C. X-ray Diffraction measurement showed only pyrite phase and energy dispersive spectroscopy (EDS) showed 1:2 ratio for iron to sulfur. Depth profile using X-ray Photoelectron Spectroscopy showed a full conversion of iron oxide into pyrite. Increasing the temperature beyond 350°C, grain size got bigger, but pyrrhotite phase with very low resistivity started to appear.
Keywords :
X-ray chemical analysis; X-ray diffraction; X-ray photoelectron spectra; annealing; chemical vapour deposition; electrical resistivity; grain size; iron compounds; thin films; APCVD; EDS; FeS2; Mo-SiO2; SiO2; X-ray diffraction; X-ray photoelectron spectroscopy; annealing; atmospheric pressure chemical vapor deposition; band-gap; depth profile; electrical resistivity; elemental sulfur environment; energy dispersive spectroscopy; grain size; iron oxide sulfurization; light absorption coefficient; marcasite; molybdenum-coated glass; phase pure iron pyrite; photovoltaic application; plain glass; pressure 1 atm; pyrrhotite phase; sputtered iron oxide; stoichiometry; thin film iron pyrite; Annealing; Films; Glass; Iron; Substrates; Temperature measurement; X-ray scattering; APCVD; iron pyrite; sulfur annealing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925411
Filename :
6925411
Link To Document :
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