DocumentCode :
1220888
Title :
On Cross Sections for Electron Impact Ionization of Multicharged Ions
Author :
Barfield, W.D.
Author_Institution :
Los Alamos Scientific Laboratory of the University of California Los Alamos, New Mexico 87545
Volume :
6
Issue :
1
fYear :
1978
fDate :
3/1/1978 12:00:00 AM
Firstpage :
71
Lastpage :
75
Abstract :
Electron impact ionization cross sections calculated by means of two semi-empirical expressions (Lotz, Seaton), a semiclassical model (Burgess: "ECIP"), and a simple quantum approximation (Seaton) are compared with results of more elaborate quantum (Coulomb-Born) calculations and measurements for several multicharged ions (N2+, Mg2+, C3+, O3+, C5+, O5+, Fe14+). While in some cases the comparisons are not definitive, the simple formula of Lotz appears to represent the C-B and experimental results more consistently than the other methods.
Keywords :
Corona; Current measurement; Electrons; Impact ionization; Integrated circuit modeling; Interference; Iron; Laboratories; Plasma devices; Tokamaks;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.1978.4317088
Filename :
4317088
Link To Document :
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