DocumentCode
1221091
Title
Performance degradation due to extrinsic base encroachment in advanced narrow-emitter bipolar circuits. I. Basic inverter
Author
Chuang, C.T.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
36
Issue
9
fYear
1989
fDate
9/1/1989 12:00:00 AM
Firstpage
1751
Lastpage
1756
Abstract
It is shown that, depending on the circuit families used, the extrinsic base encroachment results in distinct effects on the operation and performance of the circuits. The design considerations and scaling implications, using a basic inverter as an example for a saturating circuit, are discussed. It is shown that while the extrinsic base encroachment causes increases in the delay time, fall time, and risetime of a basic bipolar junction transistor inverter, the saturation time of the inverter actually decreases, since the transistor is driven less deeply into saturation due to reduced collector current (reduced current gain). The decrease in the saturation time, however, is accompanied by the reduced noise margin, especially for narrow emitter stripes. Cases for nonsaturating circuits are discussed in Part II using nonthreshold logic as an example
Keywords
bipolar integrated circuits; integrated logic circuits; advanced bipolar ICs; basic inverter; bipolar junction transistor; collector current reduction; delay time; design considerations; extrinsic base encroachment; fall time; logic circuits; narrow-emitter bipolar circuits; noise margin reduction; performance degradation; risetime; saturating circuit; saturation time; scaling implications; Bipolar transistors; Circuit noise; Circuit simulation; Degradation; Delay effects; Inverters; Logic circuits; Logic devices; Noise reduction; Numerical simulation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.34239
Filename
34239
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