DocumentCode :
1221135
Title :
Parameter Estimation Employing a Dual-Channel Sine-Wave Model Under a Gaussian Assumption
Author :
Händel, Peter
Author_Institution :
ACCESS Linnaeus Center, R. Inst. of Technol., Stockholm
Volume :
57
Issue :
8
fYear :
2008
Firstpage :
1661
Lastpage :
1669
Abstract :
The Cramer-Rao bound (CRB) is a lower bound on the error variance of any estimator. For a Gaussian scenario, the CRB is derived for a seven-parameter, dual-channel sine-wave model, which is a model relevant to applications such as impedance measurements and the estimation of particle size and velocity by laser anemometry. Four different parameterizations were considered: the common quadrature/in-phase and amplitude-phase models and two relative amplitude-phase models. The CRB indicated the achievable error variance of an unbiased estimator as a function of the signal-to-noise ratio (SNR), the number of samples, and noise power. A nonlinear least squares fit of the signal model to the collected data was employed. The problem at hand is separable and can be solved by a 1-D search followed by a linear least squares fit of the remaining parameters. The performance of the method was investigated with the aid of a simulation study, and the outcome was compared with that of the corresponding CRB and with a recently proposed seven-parameter fit. For high SNRs, the performance of the proposed method is close to optimal with an error variance close to the predictions made by the CRB.
Keywords :
IEEE standards; error analysis; least squares approximations; parameter estimation; signal processing; Cramer-Rao bound; amplitude-phase model; dual-channel sine-wave model; error variance; laser anemometry; nonlinear least squares fit; parameter estimation; particle size estimation; quadrature/in-phase model; signal-to-noise ratio; CramÉr–Rao bound (CRB); Cram??r??Rao bound (CRB); IEEE Standards 1057 and 1241; line spectral analysis; nonlinear least squares (NLS); seven-parameter model; sine-wave fit;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.923782
Filename :
4523342
Link To Document :
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