• DocumentCode
    122115
  • Title

    Influence of soiling layer on quantum efficiency and spectral reflectance on crystalline silicon PV modules

  • Author

    John, Jim Joseph ; Tatapudi, Sai ; Tamizhmani, G.

  • Author_Institution
    Indian Inst. of Technol. Bombay, Mumbai, India
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2595
  • Lastpage
    2599
  • Abstract
    Reduction in transmittance of glass superstrate due to soiling on PV modules is studied by various groups throughout the world. However, the soil layer changes not only the irradiance level but also changes the spectral distribution of the incoming solar radiation. In this work, we have selected three solar cells within a commercial module covered with different thickness of soil layer. These soiled solar cells within a module are used to study the spectral reflectance and quantum efficiency changes at various wavelengths. Heavily soiled solar cell (~74.6gm/m2) showed a very high reflectance loss and very low quantum efficiency at all wavelengths with respect to after-cleaning. The three soiled solar cells were then cleaned using three different cleaning techniques - 60psi compressed air clean, brush assisted 30psi compressed air clean and water cleaned. Short circuit current, spectral reflectance´s and quantum efficiency´s dependence on wavelengths is studied before and after each cleaning steps.
  • Keywords
    cleaning; elemental semiconductors; silicon; soil; solar cells; sunlight; Si; brush assisted compressed air clean; cleaning techniques; compressed air clean; crystalline silicon PV modules; glass superstrate transmittance; heavily soiled solar cell; irradiance level; quantum efficiency; short circuit current; soil layer thickness; soiling layer; solar radiation; spectral distribution; spectral reflectance; PV modules; Soiling; photovoltaic cells; quantum efficiency; reflectance; silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925462
  • Filename
    6925462