• DocumentCode
    1221175
  • Title

    Optimum semiconductors for high-power electronics

  • Author

    Shenai, Krishna ; Scott, Robert S. ; Baliga, B.Jayant

  • Author_Institution
    General Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
  • Volume
    36
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    1811
  • Lastpage
    1823
  • Abstract
    Elemental and compound semiconductors, including wide-bandgap semiconductors, are critically examined for high-power electronic applications in terms of several parameters. On the basis of an analysis applicable to a wide range of semiconducting materials and by using the available measured physical parameters, it is shown that wide-bandgap semiconductors such as SiC and diamond could offer significant advantages compared to either silicon or group III-V compound semiconductors for these applications. The analysis uses peak electric field strength at avalanche breakdown as a critical material parameter for evaluating the quality of a semiconducting material for high-power electronics. Theoretical calculations show improvement by orders of magnitude in the on-resistance, twentyfold improvement in the maximum frequency of operation, and potential for successful operation at temperatures beyond 600°C for diamond high-power devices. New figures of merit for power-handling capability that emphasize electrical and thermal conductivities of the material are derived and are applied to various semiconducting materials. It is shown that an improvement in power-handling capabilities of semiconductor devices by three orders of magnitude is feasible by replacing silicon with silicon carbide; improvement in power-handling capability by six orders of magnitude is projected for diamond-based devices
  • Keywords
    diamond; elemental semiconductors; power integrated circuits; power transistors; semiconductor devices; semiconductor materials; semiconductors; silicon compounds; thyristors; 600 degC; C; SiC; avalanche breakdown; diamond; electrical conductivity; high-power electronic applications; peak electric field strength; power-handling capability; thermal conductivities; wide-bandgap semiconductors; Avalanche breakdown; Conducting materials; Frequency; III-V semiconductor materials; Semiconductivity; Semiconductor devices; Semiconductor materials; Silicon carbide; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.34247
  • Filename
    34247