DocumentCode :
122120
Title :
Fast electrical modeling for spatially-resolved characterization of amorphous silicon photovoltaic cells
Author :
Xiaofeng Wu ; Bliss, Martin ; Jiang Zhu ; Betts, Thomas R. ; Gottschalg, Ralph
Author_Institution :
CREST, Loughborough Univ., Loughborough, UK
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2620
Lastpage :
2625
Abstract :
A fast spatially-resolved electrical modeling approach for amorphous silicon (a-Si) photovoltaic (PV) cells is introduced. An a-Si PV cell can be represented by a discrete circuit network of equivalent diode units and series resistances. The local diode unit is based on Merten´s variant of single-diode model, including an additional loss term an effective mobility lifetime. This approach considers the lateral resistances and uses a PV-oriented nodal analysis (PVONA) algorithm as the simulation engine. PVONA allows the simulation of an operating point of a cell with 1000×1000 subcells in 15 minutes on a standard desktop PV. Case studies show that it is feasible to be applied in simulating spatially-resolved characterization measurement e.g. electroluminescence (EL) imaging, or in predicting the performance of a cell under different operating conditions, for quantitatively analysis of the global and local electrical properties. The method has been applied to simulate a-Si PV cells operating under different conditions, finding that it is capable of accessing local operating points and the overall I-V characteristics.
Keywords :
amorphous semiconductors; elemental semiconductors; integrated circuit modelling; silicon; solar cells; EL imaging; I-V characteristics; Merten variant; PV cells; PV-oriented nodal analysis algorithm; PVONA algorithm; Si; amorphous silicon photovoltaic cells; discrete circuit network; effective mobility lifetime; electroluminescence imaging; equivalent diode units; fast spatially-resolved electrical modeling approach; global electrical properties; local diode unit; local electrical properties; loss term; series resistances; simulation engine; single-diode model; spatially-resolved characterization; standard desktop PV; Analytical models; Arrays; Degradation; Equations; Integrated circuit modeling; Mathematical model; Numerical models; amorphous silicon solar cells; circuit simulation; spatially-resolved modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925467
Filename :
6925467
Link To Document :
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