• DocumentCode
    1221246
  • Title

    Common-emitter current gain of AlxGa1-xAs/GaAs/GaAs heterojunction bipolar transistors operating at small collector current

  • Author

    Liou, J.J.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
  • Volume
    36
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    1850
  • Lastpage
    1852
  • Abstract
    A recently developed current gain model, which accounts for high-current effects and can adequately characterize the current gain at high collector current, is improved by including both interfacial and bulk space-charge-region recombination currents, resulting in a comprehensive model that predicts the current gain more accurately at small collector currents. Comparison of the model and measured data for an Al0.25Ga0.75/GaAs/GaAs heterojunction bipolar transistor is included in support of the model
  • Keywords
    III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlxGa1-xAs-GaAs; HBT; III-V semiconductors; bulk space-charge-region; common-emitter current gain; current gain model; heterojunction bipolar transistors; high-current effects; interfacial space-charge region; recombination currents; small collector current; Bipolar transistors; Charge carrier processes; Current density; Electron emission; Gallium arsenide; Heterojunction bipolar transistors; Predictive models; Semiconductor process modeling; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.34254
  • Filename
    34254