DocumentCode :
122174
Title :
High efficiency thin film solar cells deposited at the amorphous-tomicrocrystalline transition using SiF4/H2/Ar gas mixtures
Author :
Dornstetter, Jean-Christophe ; Bruneau, Bastien ; Bulkin, Pavel ; Johnson, Erik V. ; Roca i Cabarrocas, Pere
Author_Institution :
TOTAL New Energies, La Défense, France
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2839
Lastpage :
2841
Abstract :
Microcrystalline silicon deposited from SiF4/H2/Ar gas mixtures is used as active absorbing layer in thin film solar cells. Best solar cells are made from active layers deposited at the amorphous-to-microcrystalline transition where only a few percent of amorphous phase is present. Based on mass spectrometry measurements, we propose a simple model which accounts for the relevant features of the complex plasma chemistry: namely the depletion of H2, the formation of HF molecules and the amorphous to microcrystalline silicon transition. The specificity of SiF4/H2/Ar plasma is the ability to tightly tune the transition irrespective of the control of the deposition rate. A high crystalline fraction allows thicknesses above 3 μm with a high short-circuit current and no deterioration of the open-circuit voltage.
Keywords :
amorphous semiconductors; argon; elemental semiconductors; gas mixtures; hydrogen; mass spectra; plasma chemistry; semiconductor thin films; silicon; silicon compounds; solar cells; thin film devices; active absorbing layer; amorphous-to-microcrystalline silicon transition; complex plasma chemistry; deposition rate control; gas mixtures; high efficiency thin film solar cells; mass spectrometry measurements; microcrystalline silicon; open-circuit voltage; short-circuit current; Films; Photovoltaic cells; Plasma measurements; Plasmas; Radio frequency; Silicon; amorphous silicon; amorphous-to-microcrystalline transition; microcrystalline silicon; silicon tetrafluoride; solar-grade material;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925522
Filename :
6925522
Link To Document :
بازگشت