• DocumentCode
    122193
  • Title

    Performance characterization of a small form-factor 100X micro-optic concentrator

  • Author

    Agrawal, Gagan ; Tian Gu ; Haney, Michael W.

  • Author_Institution
    Univ. of Delaware, Newark, DE, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2912
  • Lastpage
    2916
  • Abstract
    Optical performance of micro-concentrator optics developed under the Microsystems-Enabled Photovoltaics (MEPV) program is investigated experimentally. The second generation prototype module is designed to have a 100X geometric concentration ratio, ±2.5° acceptance angle and a lens “sandwich” thickness of 5.30mm. Indoor experimental measurements with simulated light sources on optical modules without AR coatings show a focused transmission of ~76% (air-optics-air) across 400-1127nm for the current prototype, with losses due to interface reflection, scattering, material absorption and imperfect optical edge effects. With appropriate AR coatings and solar cells immersed in the optics, it is projected that a fully assembled module will achieve a focused optical transmission of over 84%. Outdoor characterization of the optical modules under natural sunlight is being performed.
  • Keywords
    light absorption; light reflection; light scattering; light transmission; microlenses; solar cells; solar energy concentrators; AR coatings; MEPV program; current prototype; focused optical transmission; interface reflection; lens; light sources; material absorption; microconcentrator optics; microsystem-enabled photovoltaics; natural sunlight; optical edge effects; optical modules; scattering; small form-factor 100X microoptic concentrator; solar cells; Adaptive optics; Optical imaging; Optical reflection; Optical scattering; Optical variables measurement; Prototypes; Spectroscopy; microoptics; multijunction solar cells; photovoltaic cells; photovoltaic systems; solar energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925541
  • Filename
    6925541