Title :
0.5-W single transverse-mode operation of an 850-nm diode-pumped surface-emitting semiconductor laser
Author :
Hastie, Jennifer E. ; Hopkins, John-Mark ; Calvez, Stephane ; Jeon, Chan Wook ; Burns, David ; Abram, Richard ; Riis, Erling ; Ferguson, Allister I. ; Dawson, Martin D.
Author_Institution :
Inst. of Photonics, Univ. of Strathclyde, Glasgow, UK
fDate :
7/1/2003 12:00:00 AM
Abstract :
We report the power scaling of a diode-pumped GaAs-based 850-nm vertical external-cavity surface-emitting laser, by use of an intracavity silicon carbide (SiC) heatspreader optically contacted to the semiconductor surface. To our knowledge, this is the first demonstration of bonding of SiC to a III-V semiconductor structure using the technique of liquid capillarity. High output power of >0.5 W in a circularly symmetric, TEM/sub 00/ output beam has been achieved with a spectral shift of only 0.6 nm/W of pump power. No thermal rollover was evident up to the highest pump power available, implying significant further output-power scaling potential using this approach.
Keywords :
III-V semiconductors; adhesion; gallium arsenide; heat conduction; laser modes; laser transitions; optical pumping; semiconductor lasers; surface emitting lasers; 0.5 W; 850 nm; GaAs; GaAs-based vertical external-cavity surface-emitting laser; III-V semiconductor structure; VCSEL; bonding; circularly symmetric output beam; diode-pumped surface-emitting semiconductor laser; intracavity silicon carbide heatspreader; optically contacted; output-power scaling potential; power scaling; pump power; semiconductor surface; single transverse-mode operation; spectral shift; Bonding; III-V semiconductor materials; Optical pumping; Power generation; Power lasers; Semiconductor diodes; Semiconductor lasers; Silicon carbide; Surface emitting lasers; Vertical cavity surface emitting lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.813446