Outdoor exposure tests of silicon crystalline photovoltaic for reliability

Author

Hyun-A Kim ; Jung-Jin Choi ; Sang-Cheol Kim

Author_Institution

Korea Conformity Labs., Seoul, South Korea

fYear

2014

fDate

8-13 June 2014

Firstpage

3193

Lastpage

3196

Abstract

The photovoltaic (PV) system is one of the renewable energies that attract the attention of researchers in the recent decades. The evaluation of the PV performance requires the measurement of the current as a function of irradiance, temperature, humidity, wind power and wind direction. This work presents a degradation factor of silicon crystalline photovoltaics based on maximum yield power generation tracking system in outdoor exposure. Outdoor exposure tests of silicon crystalline PV have been conducted in Seosan-si, Chungcheongnam-do, Republic of Korea.

Keywords

elemental semiconductors; integrated circuit reliability; integrated circuit testing; photovoltaic power systems; silicon; solar cells; PV system; maximum yield power generation tracking system; outdoor exposure; outdoor exposure tests; photovoltaic system; reliability; renewable energies; silicon crystalline photovoltaic degradation factor; wind direction; wind power; Atmospheric measurements; Companies; Indexes; Moisture measurement; Power measurement; Temperature measurement; Wind power generation; Silicon crystalline photovoltaic; degradation; failure modes; field experience; maximum yield power generation tracking system; outdoor test; photovoltaic; reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th

Conference_Location

Denver, CO

Type

conf

DOI

10.1109/PVSC.2014.6925614

Filename

6925614